TESCAN AMBER X Rasterelektronenmikroskop mit Xenon-Plasma-FIB – FAPS – Lehrstuhl für Fertigungsautomatisierung und Produktionssystematik
Institute for Factory Automation and Production Systems Installs TESCAN AMBER X Plasma FIB-SEM for Diverse Set of Materials Research Projects | American Laboratory
TESCAN AMBER X - TESCAN
Tescan AMBER X for Material Science
TESCAN, Czech Republic – Rupgonj Scientifics
TESCAN AMBER X - Micra Nanotecnologia
TESCAN AMBER
High resolution electron microscopes with x ray, and microtomography